Optical Thin Film Design
-10%
portes grátis
Optical Thin Film Design
Sarangan, Andrew
Taylor & Francis Ltd
08/2020
256
Dura
Inglês
9781138390447
15 a 20 dias
630
Descrição não disponível.
1. Fundamental Concepts. 2. Optical Thin Film Materials. 3. Transfer Matrix Method. 4. Single Layer Anti-Reflection Theory. 5. Multi-layer Anti-Reflection Theory. 6. High-Reflection Designs. 7. Herpin Equivalent Index & Phase Thickness. 8. Edge Filters. 9. Line Pass Filters. 10. Band Pass Filters. 11. Thin Film Designs for Oblique Incidence. 12. Metal Film Optics. 13. Thin Film Designs Using Phase Change Materials. 14. Deposition Methods.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Reference Wavelength;Refractive Index;Metal Film Optics;TMM;Band pass filters;Reflection Spectrum;Line Pass filters;Phase Thickness;Anti-reflective coating;Unit Cells;Edge filters;Substrate Index;Transfer matrix method;Optical Thin Film;Short Pass Filter;optical components;Loss Tangent;numerical optimization;Stop Band;electromagnetics;Calculated Reflection Spectrum;phase change materials;Equivalent Index;Absentee Layer;TM Polarization;Power Flux;Silica Glass Substrate;Photonic Bandgap;Low Index Film;Periodic Stack;Transmission Peak;Thin Film Design;Refractive Index Contrast;Complex Refractive Index
1. Fundamental Concepts. 2. Optical Thin Film Materials. 3. Transfer Matrix Method. 4. Single Layer Anti-Reflection Theory. 5. Multi-layer Anti-Reflection Theory. 6. High-Reflection Designs. 7. Herpin Equivalent Index & Phase Thickness. 8. Edge Filters. 9. Line Pass Filters. 10. Band Pass Filters. 11. Thin Film Designs for Oblique Incidence. 12. Metal Film Optics. 13. Thin Film Designs Using Phase Change Materials. 14. Deposition Methods.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Reference Wavelength;Refractive Index;Metal Film Optics;TMM;Band pass filters;Reflection Spectrum;Line Pass filters;Phase Thickness;Anti-reflective coating;Unit Cells;Edge filters;Substrate Index;Transfer matrix method;Optical Thin Film;Short Pass Filter;optical components;Loss Tangent;numerical optimization;Stop Band;electromagnetics;Calculated Reflection Spectrum;phase change materials;Equivalent Index;Absentee Layer;TM Polarization;Power Flux;Silica Glass Substrate;Photonic Bandgap;Low Index Film;Periodic Stack;Transmission Peak;Thin Film Design;Refractive Index Contrast;Complex Refractive Index
